High-sensitivity optically modulated scatterer for electromagnetic-field measurement

Ray Rong Lao*, Wen Lie Liang, Wen Tron Shay, Richard P. Thompson, Richard A. Dudley, Olivier Merckel, Nicolas Ribière-Tharaud, Jean Charles Bolomey, Jenn-Hawn Tarng


研究成果: Article同行評審

10 引文 斯高帕斯(Scopus)


The optically modulated-scatterer (OMS) technique is developed for electromagnetic-field-distribution measurement with minimum disturbance to the field under test. In this paper, an OMS with newly designed photoconductive-switching structure is proposed. The performances of the new OMS are evaluated with a monostatic-field-measurement system. Measurement results show that an improvement of 6 to 8 dB in sensitivity is achieved compared to previous OMS devices. The developed OMS was used in an electromagnetic-field-distribution mapping system to measure the field distribution in a cubic phantom radiated by a mobile phone. The results show the suitability of this OMS for specific-absorption-rate measurement application.

頁(從 - 到)486-490
期刊IEEE Transactions on Instrumentation and Measurement
出版狀態Published - 1 4月 2007


深入研究「High-sensitivity optically modulated scatterer for electromagnetic-field measurement」主題。共同形成了獨特的指紋。