High-reliability dynamic-threshold source-side injection for 2-bit/cell with MLC operation of wrapped select-gate SONOS in NOR-type flash memory
Kuan Ti Wang*, Tien-Sheng Chao, Woei Cherng Wu, Wen Luh Yang, Chien Hsing Lee, Tsung Min Hsieh, Jhyy Cheng Liou, Shen De Wang, Tzu Ping Chen, Chien Hung Chen, Chih Hung Lin, Hwi Huang Chen
*此作品的通信作者
研究成果: Article › 同行評審
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斯高帕斯（Scopus）