High linearity AlGaN/GaN HEMTs with Au-free Ti/Al/Ni/Ti ohmic contacts for Ka-band applications

Che Wei Hsu*, Yueh Chin Lin, Shao Lun Lee, Kai Wen Chen, Ying Ciao Chen, Edward Yi Chang

*此作品的通信作者

研究成果: Article › 同行評審

指紋

深入研究「High linearity AlGaN/GaN HEMTs with Au-free Ti/Al/Ni/Ti ohmic contacts for Ka-band applications」主題。共同形成了獨特的指紋。

Keyphrases

Engineering