Heterointerface quality of InGaP-GaAs superlattices determined by photopumping, x-ray analysis, and transmission electron microscopy

Q. Yang*, D. A. Kellogg, Chun-Hsiung Lin, G. E. Stillman, N. Holonyak

*此作品的通信作者

研究成果: Article同行評審

7 引文 斯高帕斯(Scopus)

摘要

Data are presented on the room-temperature, photopumped, continuous laser operation of multiple-well InGaP-GaAs quantum-well heterostructures and superlattices grown by low-pressure metalorganic chemical vapor deposition. Continuous laser operation at room temperature indicates high material quality and minimal nonradiative recombination at the heterointerfaces. The lasing wavelength near the GaAs band gap is consistent with weak bandfilling, and small quantum confinement of electrons and large confinement of holes (mh>me, ΔEu>ΔEc). Double-crystal x-ray diffraction and transmission electron microscopy data confirm the high material quality and heterointerface abruptness.

原文English
頁(從 - 到)1101-1103
頁數3
期刊Applied Physics Letters
75
發行號8
DOIs
出版狀態Published - 23 8月 1999

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