Guest Editorial Celebrating 75 Years of Excellence: The Enduring Legacy and Future Outlook of the IEEE Reliability Society

Jason Rupe, Phil Laplante, Shiuhpyng Winston Shieh

研究成果

原文	English
頁（從 - 到）	3-6
頁數	4
期刊	IEEE Transactions on Reliability
卷	73
發行號	1
DOIs	https://doi.org/10.1109/TR.2024.3366027
出版狀態	Published - 1 3月 2024

存取文件

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