摘要
(Cu/Co)10 was deposited on SiO2/Si(1 0 0) and Si(1 0 0) respectively, by e-beam evaporation. For the multilayer on Si(1 0 0), the MR was about 9.1% at 10 K and it reduced to 4% at room temperature, while for the sample on SiO2/Si(1 0 0), the MR at 10 and 300 K were 19%, and 7.2%, respectively. The MR extracted from minor R-H loop was higher than that in major R-H loop. This could be due to the increment of domain wall which enhances the electrons scattering.
原文 | English |
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頁(從 - 到) | 131-134 |
頁數 | 4 |
期刊 | Journal of Magnetism and Magnetic Materials |
卷 | 209 |
發行號 | 1-3 |
DOIs | |
出版狀態 | Published - 1 1月 2000 |
事件 | Proceedings of the 1999 International Symposium on Advanced Magnetic Technologies (ISAMT'99) - Taipei, Taiwan 持續時間: 24 5月 1999 → 25 5月 1999 |