Gate Voltages Impacting on Latch-up Measurements

Shao Chang Huang; Jian Hsing Lee; Chun Chih Chen; Ching Ho Li; Chih Cherng Liao; Kai Chieh Hsu; Gong Kai Lin; Li Fan Chen; Chien Wei Wang; Chih Hsuan Lin; Yeh Ning Jou; Ke Horng Chen

doi:10.1109/ICCE-Taiwan55306.2022.9869282

Gate Voltages Impacting on Latch-up Measurements

Shao Chang Huang, Jian Hsing Lee, Chun Chih Chen, Ching Ho Li, Chih Cherng Liao, Kai Chieh Hsu, Gong Kai Lin, Li Fan Chen, Chien Wei Wang, Chih Hsuan Lin, Yeh Ning Jou, Ke Horng Chen

電機工程學系

研究成果: Conference contribution › 同行評審

摘要

Integrated Circuits (ICs) are often turned off under latch-up measurements. One power IC is often applied with a large size for driving capabilities. The large size device is often difficult to be turned off under latch-up stresses. In this paper, device behaviors of different gate biased voltages applied on large size devices under latch-up measurements are discussed. From the silicon data analyses, latch-up current paths changed from MOSFET to the parasitic diodes are observed well so the false latch-up test is verified. Finally, over voltage test is proposed for turned-on large size devices' latch-up measurements.

原文	English
主出版物標題	Proceedings - 2022 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2022
發行者	Institute of Electrical and Electronics Engineers Inc.
頁面	75-76
頁數	2
ISBN（電子）	9781665470506
DOIs	https://doi.org/10.1109/ICCE-Taiwan55306.2022.9869282
出版狀態	Published - 2022
事件	2022 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2022 - Taipei, 台灣持續時間: 6 7月 2022 → 8 7月 2022

出版系列

名字	Proceedings - 2022 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2022

Conference

Conference	2022 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2022
國家/地區	台灣
城市	Taipei
期間	6/07/22 → 8/07/22

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10.1109/ICCE-Taiwan55306.2022.9869282

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Link to publication in Scopus

引用此

Huang, S. C., Lee, J. H., Chen, C. C., Li, C. H., Liao, C. C., Hsu, K. C., Lin, G. K., Chen, L. F., Wang, C. W., Lin, C. H., Jou, Y. N., & Chen, K. H. (2022). Gate Voltages Impacting on Latch-up Measurements. 於 Proceedings - 2022 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2022 (頁 75-76). (Proceedings - 2022 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2022). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICCE-Taiwan55306.2022.9869282

Huang, Shao Chang ; Lee, Jian Hsing ; Chen, Chun Chih 等. / Gate Voltages Impacting on Latch-up Measurements. Proceedings - 2022 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2022. Institute of Electrical and Electronics Engineers Inc., 2022. 頁 75-76 (Proceedings - 2022 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2022).

@inproceedings{6237298d0cdb48c297b396779ca504b6,

title = "Gate Voltages Impacting on Latch-up Measurements",

abstract = "Integrated Circuits (ICs) are often turned off under latch-up measurements. One power IC is often applied with a large size for driving capabilities. The large size device is often difficult to be turned off under latch-up stresses. In this paper, device behaviors of different gate biased voltages applied on large size devices under latch-up measurements are discussed. From the silicon data analyses, latch-up current paths changed from MOSFET to the parasitic diodes are observed well so the false latch-up test is verified. Finally, over voltage test is proposed for turned-on large size devices' latch-up measurements.",

author = "Huang, {Shao Chang} and Lee, {Jian Hsing} and Chen, {Chun Chih} and Li, {Ching Ho} and Liao, {Chih Cherng} and Hsu, {Kai Chieh} and Lin, {Gong Kai} and Chen, {Li Fan} and Wang, {Chien Wei} and Lin, {Chih Hsuan} and Jou, {Yeh Ning} and Chen, {Ke Horng}",

note = "Publisher Copyright: {\textcopyright} 2022 IEEE.; 2022 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2022 ; Conference date: 06-07-2022 Through 08-07-2022",

year = "2022",

doi = "10.1109/ICCE-Taiwan55306.2022.9869282",

language = "English",

series = "Proceedings - 2022 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2022",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "75--76",

booktitle = "Proceedings - 2022 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2022",

address = "美國",

}

Huang, SC, Lee, JH, Chen, CC, Li, CH, Liao, CC, Hsu, KC, Lin, GK, Chen, LF, Wang, CW, Lin, CH, Jou, YN & Chen, KH 2022, Gate Voltages Impacting on Latch-up Measurements. 於 Proceedings - 2022 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2022. Proceedings - 2022 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2022, Institute of Electrical and Electronics Engineers Inc., 頁 75-76, 2022 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2022, Taipei, 台灣, 6/07/22. https://doi.org/10.1109/ICCE-Taiwan55306.2022.9869282

Gate Voltages Impacting on Latch-up Measurements. / Huang, Shao Chang; Lee, Jian Hsing; Chen, Chun Chih 等.
Proceedings - 2022 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2022. Institute of Electrical and Electronics Engineers Inc., 2022. p. 75-76 (Proceedings - 2022 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2022).

研究成果: Conference contribution › 同行評審

TY - GEN

T1 - Gate Voltages Impacting on Latch-up Measurements

AU - Huang, Shao Chang

AU - Lee, Jian Hsing

AU - Chen, Chun Chih

AU - Li, Ching Ho

AU - Liao, Chih Cherng

AU - Hsu, Kai Chieh

AU - Lin, Gong Kai

AU - Chen, Li Fan

AU - Wang, Chien Wei

AU - Lin, Chih Hsuan

AU - Jou, Yeh Ning

AU - Chen, Ke Horng

PY - 2022

Y1 - 2022

N2 - Integrated Circuits (ICs) are often turned off under latch-up measurements. One power IC is often applied with a large size for driving capabilities. The large size device is often difficult to be turned off under latch-up stresses. In this paper, device behaviors of different gate biased voltages applied on large size devices under latch-up measurements are discussed. From the silicon data analyses, latch-up current paths changed from MOSFET to the parasitic diodes are observed well so the false latch-up test is verified. Finally, over voltage test is proposed for turned-on large size devices' latch-up measurements.

AB - Integrated Circuits (ICs) are often turned off under latch-up measurements. One power IC is often applied with a large size for driving capabilities. The large size device is often difficult to be turned off under latch-up stresses. In this paper, device behaviors of different gate biased voltages applied on large size devices under latch-up measurements are discussed. From the silicon data analyses, latch-up current paths changed from MOSFET to the parasitic diodes are observed well so the false latch-up test is verified. Finally, over voltage test is proposed for turned-on large size devices' latch-up measurements.

UR - http://www.scopus.com/inward/record.url?scp=85138729976&partnerID=8YFLogxK

U2 - 10.1109/ICCE-Taiwan55306.2022.9869282

DO - 10.1109/ICCE-Taiwan55306.2022.9869282

M3 - Conference contribution

AN - SCOPUS:85138729976

T3 - Proceedings - 2022 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2022

SP - 75

EP - 76

BT - Proceedings - 2022 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2022

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2022 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2022

Y2 - 6 July 2022 through 8 July 2022

ER -

Huang SC, Lee JH, Chen CC, Li CH, Liao CC, Hsu KC 等. Gate Voltages Impacting on Latch-up Measurements. 於 Proceedings - 2022 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2022. Institute of Electrical and Electronics Engineers Inc. 2022. p. 75-76. (Proceedings - 2022 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-Taiwan 2022). doi: 10.1109/ICCE-Taiwan55306.2022.9869282

Gate Voltages Impacting on Latch-up Measurements

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