摘要
GaN-on-sapphire structure with a Ga2O3 sacrificial layer was employed for the chemical lift-off process application. The (201) β-oriented Ga2O3 thin film was first deposited on the c-plane sapphire substrate using pulsed laser deposition, followed by the GaN growth via metalorganic vapor phase epitaxy under N2 and H 2 environment in sequence. From the transmission-electron-microscopy observation, the orientation relationship between GaN and β-Ga 2O3 was identified as GaN [11 20] Ga2O 3[010]. A GaN epilayer with an electroplated copper substrate was demonstrated using a chemical lift-off process where the Ga2O 3 sacrificial layer can be laterally etched out with a hydrofluoric solution.
原文 | English |
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頁(從 - 到) | H434-H437 |
期刊 | Electrochemical and Solid-State Letters |
卷 | 14 |
發行號 | 11 |
DOIs | |
出版狀態 | Published - 2011 |