Fringing electric field effect on 65-nm-node fully depleted silicon-on-insulator devices

Ming Wen Ma*, Tien-Sheng Chao, Kuo Hsing Kao, Jyun Siang Huang, Tan Fu Lei

*此作品的通信作者

研究成果: Article同行評審

3 引文 斯高帕斯(Scopus)

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Engineering & Materials Science

Physics & Astronomy