Foreword

Shyh-Jye Jou^*, C. Patrick Yue

^*此作品的通信作者

研究成果: Editorial

原文	English
文章編號	5783574
期刊	Proceedings of 2011 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2011
DOIs	https://doi.org/10.1109/VDAT.2011.5783574
出版狀態	Published - 28 6月 2011
事件	2011 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2011 - Hsinchu, Taiwan 持續時間: 25 4月 2011 → 28 4月 2011

存取文件

@article{374b73168bb14afaa397607f876162db,

title = "Foreword",

author = "Shyh-Jye Jou and Yue, {C. Patrick}",

year = "2011",

month = jun,

day = "28",

doi = "10.1109/VDAT.2011.5783574",

language = "English",

journal = "Proceedings of 2011 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2011",

note = "null ; Conference date: 25-04-2011 Through 28-04-2011",

}

TY - JOUR

T1 - Foreword

AU - Jou, Shyh-Jye

AU - Yue, C. Patrick

PY - 2011/6/28

Y1 - 2011/6/28

UR - http://www.scopus.com/inward/record.url?scp=79959524031&partnerID=8YFLogxK

U2 - 10.1109/VDAT.2011.5783574

DO - 10.1109/VDAT.2011.5783574

M3 - Editorial

AN - SCOPUS:79959524031

JO - Proceedings of 2011 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2011

JF - Proceedings of 2011 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2011

M1 - 5783574

Y2 - 25 April 2011 through 28 April 2011

ER -