TY - JOUR
T1 - Foreword
AU - Jou, Shyh-Jye
AU - Yue, C. Patrick
PY - 2011/6/28
Y1 - 2011/6/28
UR - http://www.scopus.com/inward/record.url?scp=79959524031&partnerID=8YFLogxK
U2 - 10.1109/VDAT.2011.5783574
DO - 10.1109/VDAT.2011.5783574
M3 - Editorial
AN - SCOPUS:79959524031
JO - Proceedings of 2011 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2011
JF - Proceedings of 2011 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2011
M1 - 5783574
T2 - 2011 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2011
Y2 - 25 April 2011 through 28 April 2011
ER -