Flaw inspection and detection for small-pixel TFT-Array

Y. C. Wang, Bor-Shyh Lin

研究成果: Conference contribution同行評審

摘要

The display pixels and resolution on array process are getting smaller and higher precision, for advanced small-pixel and high-resolution display applications. The paper proposed the characteristics of flaw detection in small-pixel design displays based on TFT liquid crystal displays with respect to electrical-physic characterization metrics. Observer studies resulted in small-sized pixel TFT array between the flaw detection performance and maker preference approaches. Detection performance factors provided information on the differences among small-pixel design for advanced display technologies .It also shown that critical pixel defect played an important role than previously seen in non-small pixel TFT array panels for managing process yield. The method of voltage imaging for detection, developed in this study provides an initial insight into the small-sized pixel designs for advanced and precision to diagnostic images in display devices.

原文English
主出版物標題20th International Display Workshops 2013, IDW 2013
發行者International Display Workshops
頁面651-652
頁數2
ISBN(電子)9781510827783
出版狀態Published - 1 1月 2013
事件20th International Display Workshops 2013, IDW 2013 - Sapporo, Japan
持續時間: 3 12月 20136 12月 2013

出版系列

名字Proceedings of the International Display Workshops
1
ISSN(列印)1883-2490

Conference

Conference20th International Display Workshops 2013, IDW 2013
國家/地區Japan
城市Sapporo
期間3/12/136/12/13

指紋

深入研究「Flaw inspection and detection for small-pixel TFT-Array」主題。共同形成了獨特的指紋。

引用此