Five-element circuit model using linear-regression method to correct the admittance measurement of metal-oxide-semiconductor capacitor

Chao Ching Cheng^*, Chao-Hsin Chien, Guang Li Luo, Jun Cheng Liu, Yi Cheng Chen, Yao Feng Chang, Shin Yuan Wang, Chi Chung Kei, Chien Nan Hsiao, Chun Yen Chang

^*此作品的通信作者