Five-element circuit model using linear-regression method to correct the admittance measurement of metal-oxide-semiconductor capacitor

Chao Ching Cheng*, Chao-Hsin Chien, Guang Li Luo, Jun Cheng Liu, Yi Cheng Chen, Yao Feng Chang, Shin Yuan Wang, Chi Chung Kei, Chien Nan Hsiao, Chun Yen Chang

*此作品的通信作者

研究成果: Article同行評審

15 引文 斯高帕斯(Scopus)

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Engineering

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