Finite element models of neuron electrode sealing interfaces

T.m. Choi*, Shan Jen You

*此作品的通信作者

研究成果: Article同行評審

6 引文 斯高帕斯(Scopus)

摘要

It is desirable to detect any leakage current when microelectrode is used to stimulate a neuron electrically. This paper proposes a new approach to study the neuron-electrode sealing interface problem. As opposite to the traditional bi-domain FEM that need a two-step process of indirect coupling of two domains with a circuit equation, which involves solving a set of ordinary differential equation, this paper proposed a more elegant approach to study the neuron-electrode sealing interface problem based on a single domain finite element model. The result shows the stimulation electrical potential distribution and the sealing resistance match the published simulation and experimental results.

原文English
文章編號6136612
頁(從 - 到)643-646
頁數4
期刊IEEE Transactions on Magnetics
48
發行號2
DOIs
出版狀態Published - 1 2月 2012

指紋

深入研究「Finite element models of neuron electrode sealing interfaces」主題。共同形成了獨特的指紋。

引用此