Finite element analysis of antireflective silicon nitride sub-wavelength structures for solar cell applications

Huang Ming Lee; Kartika Chandra Sahoo; Yiming Li; Jong Ching Wu; Edward Yi Chang

doi:10.1016/j.tsf.2010.04.078

Finite element analysis of antireflective silicon nitride sub-wavelength structures for solar cell applications

Huang Ming Lee, Kartika Chandra Sahoo, Yiming Li, Jong Ching Wu^*, Edward Yi Chang

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8 引文斯高帕斯（Scopus）

摘要

We numerically calculate the spectral reflectivity of the silicon nitride (Si₃N₄) sub-wavelength structure (SWS) using a two-dimensional finite element simulation. The geometry-dependent effective reflectance of the Si₃N₄ SWS over the wavelength ranging from 400 nm to 1000 nm is examined and the structure of Si₃N ₄ SWS is further optimized for the lowest effective reflectance. A p-n junction solar cell efficiency based on the optimized Si₃N ₄ SWS is also calculated, resulting in an improvement of 0.98% in efficiency than that of single layer antireflection coatings.

原文	English
頁（從 - 到）	7204-7208
頁數	5
期刊	Thin Solid Films
卷	518
發行號	24
DOIs	https://doi.org/10.1016/j.tsf.2010.04.078
出版狀態	Published - 1 10月 2010

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title = "Finite element analysis of antireflective silicon nitride sub-wavelength structures for solar cell applications",

abstract = "We numerically calculate the spectral reflectivity of the silicon nitride (Si3N4) sub-wavelength structure (SWS) using a two-dimensional finite element simulation. The geometry-dependent effective reflectance of the Si3N4 SWS over the wavelength ranging from 400 nm to 1000 nm is examined and the structure of Si3N 4 SWS is further optimized for the lowest effective reflectance. A p-n junction solar cell efficiency based on the optimized Si3N 4 SWS is also calculated, resulting in an improvement of 0.98% in efficiency than that of single layer antireflection coatings.",

keywords = "Antireflection coating, Finite element simulation, Silicon nitride, Solar cell, Sub-wavelength structure",

author = "Lee, {Huang Ming} and Sahoo, {Kartika Chandra} and Yiming Li and Wu, {Jong Ching} and Chang, {Edward Yi}",

year = "2010",

month = oct,

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doi = "10.1016/j.tsf.2010.04.078",

language = "English",

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T1 - Finite element analysis of antireflective silicon nitride sub-wavelength structures for solar cell applications

AU - Lee, Huang Ming

AU - Sahoo, Kartika Chandra

AU - Li, Yiming

AU - Wu, Jong Ching

AU - Chang, Edward Yi

PY - 2010/10/1

Y1 - 2010/10/1

N2 - We numerically calculate the spectral reflectivity of the silicon nitride (Si3N4) sub-wavelength structure (SWS) using a two-dimensional finite element simulation. The geometry-dependent effective reflectance of the Si3N4 SWS over the wavelength ranging from 400 nm to 1000 nm is examined and the structure of Si3N 4 SWS is further optimized for the lowest effective reflectance. A p-n junction solar cell efficiency based on the optimized Si3N 4 SWS is also calculated, resulting in an improvement of 0.98% in efficiency than that of single layer antireflection coatings.

AB - We numerically calculate the spectral reflectivity of the silicon nitride (Si3N4) sub-wavelength structure (SWS) using a two-dimensional finite element simulation. The geometry-dependent effective reflectance of the Si3N4 SWS over the wavelength ranging from 400 nm to 1000 nm is examined and the structure of Si3N 4 SWS is further optimized for the lowest effective reflectance. A p-n junction solar cell efficiency based on the optimized Si3N 4 SWS is also calculated, resulting in an improvement of 0.98% in efficiency than that of single layer antireflection coatings.

KW - Antireflection coating

KW - Finite element simulation

KW - Silicon nitride

KW - Solar cell

KW - Sub-wavelength structure

UR - http://www.scopus.com/inward/record.url?scp=77956876601&partnerID=8YFLogxK

U2 - 10.1016/j.tsf.2010.04.078

DO - 10.1016/j.tsf.2010.04.078

M3 - Article

AN - SCOPUS:77956876601

SN - 0040-6090

VL - 518

SP - 7204

EP - 7208

JO - Thin Solid Films

JF - Thin Solid Films

IS - 24

ER -

Finite element analysis of antireflective silicon nitride sub-wavelength structures for solar cell applications

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