摘要
Atomic layer deposition (ALD)-based TiN electrode on ferroelectric HfZrO2 metal/ferroelectric/metal (MFM) capacitor and ferroelectric field-effect transistor (FeFET) is demonstrated experimentally with weight transfer, that is, Delta P, per pulse analysis through consecutive alternating potentiation/depression (Pot./Dep.) training pulses. The weight training pulse schemes are studied to have symmetric and linear synapse weight transfer to increase the accuracy and accelerate the deep neural network (DNN) training. With ALD TiN inserted, alpha(p)/alpha(d) = -0.63/-0.84, asymmetry vertical bar alpha(p) - alpha(d)vertical bar = 0.21, and polarization modulation ratio (Pot./Dep.) = 97%/98% are achieved for MFM capacitor, and alpha(p)/alpha(d) = -1.32/-1.88, asymmetry vertical bar alpha(p) - alpha(d)vertical bar = 0.56, and G(max)/G(min) > 10x are delivered for FeFET.
原文 | English |
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文章編號 | 9180313 |
頁(從 - 到) | 4201-4207 |
頁數 | 7 |
期刊 | IEEE Transactions on Electron Devices |
卷 | 67 |
發行號 | 10 |
DOIs | |
出版狀態 | Published - 10月 2020 |