FeRAM Recovery up to 200 Periods with Accumulated Endurance 1012 Cycles and an Applicable Array Circuit toward Unlimited eNVM Operations

K. Y. Hsiang*, J. Y. Lee, F. S. Chang, Z. F. Lou, Z. X. Li, Z. H. Li, J. H. Chen, C. W. Liu, T. H. Hou, M. H. Lee*

*此作品的通信作者

研究成果: Conference contribution同行評審

2 引文 斯高帕斯(Scopus)

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Engineering & Materials Science