@inproceedings{61fca18708394f4f980687f1eaabba09,
title = "Fault models for embedded-DRAM macros",
abstract = "In this paper, we compare embedded-DRAM (eDRAM) testing to both SRAM testing and commodity-DRAM testing, since an eDRAM macro uses DRAM cells with an SRAM interface. We first start from an standard SRAM test algorithm and discuss the faults which are not covered in the SRAM testing but should be considered in the DRAM testing. Then we study the behavior of those faults and the tests which can detect them. Also, we discuss how likely each modeled fault may occur on eDRAMs and commodity DRAMs, respectively.",
keywords = "Embedded DRAM, Memory testing",
author = "Chia-Tso Chao and Yang, {Hao Yu} and Huang, {Rei Fu} and Lin, {Shih Chin} and Chin, {G. Yu}",
year = "2009",
doi = "10.1145/1629911.1630097",
language = "English",
isbn = "9781605584973",
series = "Proceedings - Design Automation Conference",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "714--719",
booktitle = "2009 46th ACM/IEEE Design Automation Conference, DAC 2009",
address = "美國",
note = "2009 46th ACM/IEEE Design Automation Conference, DAC 2009 ; Conference date: 26-07-2009 Through 31-07-2009",
}