Fault models for embedded-DRAM macros

Chia-Tso Chao, Hao Yu Yang, Rei Fu Huang, Shih Chin Lin, G. Yu Chin

    研究成果: Conference contribution同行評審

    10 引文 斯高帕斯(Scopus)

    摘要

    In this paper, we compare embedded-DRAM (eDRAM) testing to both SRAM testing and commodity-DRAM testing, since an eDRAM macro uses DRAM cells with an SRAM interface. We first start from an standard SRAM test algorithm and discuss the faults which are not covered in the SRAM testing but should be considered in the DRAM testing. Then we study the behavior of those faults and the tests which can detect them. Also, we discuss how likely each modeled fault may occur on eDRAMs and commodity DRAMs, respectively.

    原文English
    主出版物標題2009 46th ACM/IEEE Design Automation Conference, DAC 2009
    發行者Institute of Electrical and Electronics Engineers Inc.
    頁面714-719
    頁數6
    ISBN(列印)9781605584973
    DOIs
    出版狀態Published - 2009
    事件2009 46th ACM/IEEE Design Automation Conference, DAC 2009 - San Francisco, CA, United States
    持續時間: 26 7月 200931 7月 2009

    出版系列

    名字Proceedings - Design Automation Conference
    ISSN(列印)0738-100X

    Conference

    Conference2009 46th ACM/IEEE Design Automation Conference, DAC 2009
    國家/地區United States
    城市San Francisco, CA
    期間26/07/0931/07/09

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