Fast and slow light property improvement in erbium-doped amplifier

P. C. Peng, F. K. Wu, W. C. Kao, Jyehong Chen, Chun-Ting Lin, S. Chi

研究成果: Article同行評審

1 引文 斯高帕斯(Scopus)

指紋

深入研究「Fast and slow light property improvement in erbium-doped amplifier」主題。共同形成了獨特的指紋。

Keyphrases

Engineering

Material Science

Chemical Engineering