Fast analog layout prototyping for nanometer design migration

Yi Peng Weng*, Hung-Ming Chen, Tung Chieh Chen, Po Cheng Pan, Chien Hung Chen, Wei-Zen Chen

*此作品的通信作者

    研究成果: Conference contribution同行評審

    28 引文 斯高帕斯(Scopus)

    摘要

    This paper presents an analog layout migration methodology to quickly provide multiple layouts while keeping similar or better circuit performance. Unlike previous works that often generate a single layout that has exactly the same topology with the original layout, this new migration algorithm is able to provide results with different aspect ratios. First, various placement constraints, including topology, matching, and symmetry, are extracted from the original layout. The extracted constraints are hierarchically stored into a topology slicing tree. Placement is performed from the bottom tree nodes to the root tree node. In each tree node, multiple placements for the subtree are recorded. All possible placements under the constraints are recorded in the root node. This algorithm has been successfully applied to a variable gain amplifier and a folded cascode operational amplifier migrating from UMC 90nm to UMC 65nm. The experimental results validate that our approach can provide reasonable layouts, even a better result almost in no time.

    原文English
    主出版物標題2011 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2011
    頁面517-522
    頁數6
    DOIs
    出版狀態Published - 2011
    事件2011 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2011 - San Jose, CA, United States
    持續時間: 7 11月 201110 11月 2011

    出版系列

    名字IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
    ISSN(列印)1092-3152

    Conference

    Conference2011 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2011
    國家/地區United States
    城市San Jose, CA
    期間7/11/1110/11/11

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