Fabrication and electrical characterization of nanoscaled-schottky diodes based on metal suicide/silicon nanowires with scanning probe lithography and wet etching

Jeng-Tzong Sheu*, Sheng Pin Yeh, Chen Hsin Lien, S. T. Tsai

*此作品的通信作者

研究成果: Article同行評審

8 引文 斯高帕斯(Scopus)

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Keyphrases

Material Science