@inproceedings{c5e2167863284e49a186f78166e8b73d,
title = "Exploring Next-Generation GaN Power Devices with Ferroelectric Charge Trap Gate Stack Technology for Normally-OFF Operations",
author = "Chang, {Edward Yi} and Wu, {Jui Sheng} and Yang, {Tsung Ying} and Tsai, {Chen Hsi}",
year = "2023",
doi = "10.23919/IWJT59028.2023.10175185",
language = "English",
series = "2023 21st International Workshop on Junction Technology, IWJT 2023",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2023 21st International Workshop on Junction Technology, IWJT 2023",
address = "美國",
note = "21st International Workshop on Junction Technology, IWJT 2023 ; Conference date: 08-06-2023 Through 09-06-2023",
}