Experimentally Determining the Top and Edge Contact Resistivities of Two-step Sulfurization Nb-Doped MoS2 Films Using the Transmission Line Measurement

Yun Yan Chung, Chi Feng Li, Chao Ting Lin, Yen Teng Ho, Chao Hsin Chien

研究成果: Article同行評審

5 引文 斯高帕斯(Scopus)

指紋

深入研究「Experimentally Determining the Top and Edge Contact Resistivities of Two-step Sulfurization Nb-Doped MoS2 Films Using the Transmission Line Measurement」主題。共同形成了獨特的指紋。

Engineering & Materials Science

Chemical Compounds