Existence of Single-Event Double-Node Upsets (SEDU) in Radiation-Hardened Latches for Sub-65nm CMOS Technologies

Sam M.H. Hsiao, Lowry P.T. Wang, Aaron C.W. Liang, Charles H.P. Wen

研究成果: Conference contribution › 同行評審

3 引文 斯高帕斯（Scopus）

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Keyphrases

Material Science

Engineering