Excess hot-carrier currents in SOI MOSFETs and its implications

Keyphrases

• Hot Carriers 100%
• Self-heating 100%
• Impact Ionization 100%
• SOI MOSFET 100%
• Power Supply 50%
• Electric Field (E-field) 50%
• Drain Bias 50%
• Lifetime Extrapolation 50%
• Thermal Time Constant 50%
• Thermal Activation Energy 50%
• Lattice Temperature 50%
• Impact Force 50%

Engineering

• Metal-Oxide-Semiconductor Field-Effect Transistor 100%
• Impact Ionization 100%
• Constant Time 50%
• Activation Energy 50%
• Power Supply 50%
• Driving Force 50%
• Drain Bias 50%
• Electric Field 50%