TY - GEN
T1 - Evaluation on efficient measurement setup for transient-induced latchup with BI-polar trigger
AU - Ker, Ming-Dou
AU - Hsu, Sheng Fu
PY - 2005/12/15
Y1 - 2005/12/15
N2 - An efficient measurement setup for transient-induced latchup (TLU) with bi-polar trigger is evaluated in this paper. The influences of the current-blocking diode and the current-limiting resistance on TLU immunity are investigated with the silicon controlled rectifier (SCR) fabricated in a 0.25-μm CMOS technology. The measurement setup without a current-blocking diode but with a small current-limiting resistance is recommended to evaluate TLU immunity of CMOS ICs. This recommended measurement setup not only can accurately judge the TLU level of CMOS ICs without over estimation, but also is beneficial to avoid electrical over-stress (EOS) damage on device under test (DUT). To further prove the utility of this recommended TLU measurement in the real circuits, a ring oscillator fabricated by 0.25-μm CMOS technology is used as the test circuit for verification.
AB - An efficient measurement setup for transient-induced latchup (TLU) with bi-polar trigger is evaluated in this paper. The influences of the current-blocking diode and the current-limiting resistance on TLU immunity are investigated with the silicon controlled rectifier (SCR) fabricated in a 0.25-μm CMOS technology. The measurement setup without a current-blocking diode but with a small current-limiting resistance is recommended to evaluate TLU immunity of CMOS ICs. This recommended measurement setup not only can accurately judge the TLU level of CMOS ICs without over estimation, but also is beneficial to avoid electrical over-stress (EOS) damage on device under test (DUT). To further prove the utility of this recommended TLU measurement in the real circuits, a ring oscillator fabricated by 0.25-μm CMOS technology is used as the test circuit for verification.
UR - http://www.scopus.com/inward/record.url?scp=28744444570&partnerID=8YFLogxK
U2 - 10.1109/RELPHY.2005.1493073
DO - 10.1109/RELPHY.2005.1493073
M3 - Conference contribution
AN - SCOPUS:28744444570
SN - 0780388038
T3 - IEEE International Reliability Physics Symposium Proceedings
SP - 121
EP - 128
BT - 2005 IEEE International Reliability Physics Symposium Proceedings, 43rd Annual
T2 - 2005 IEEE International Reliability Physics Symposium Proceedings, 43rd Annual
Y2 - 17 April 2005 through 21 April 2005
ER -