@inproceedings{c4a83c7470814c03adc967b8f4721739,
title = "Evaluation on board-level noise filter networks to suppress transient-induced latchup under system-level ESD test",
abstract = "Different types of board-level noise filter networks are evaluated for their effectiveness to improve the immunity of CMOS ICs against transient-induced latchup (TLU) under system-level electrostatic discharge (ESD) test. By choosing proper components in each noise filter network, the TLU immunity of CMOS ICs can be greatly improved. All the experimental evaluations have been verified with the SCR test structures and the ring oscillator fabricated in a 0.25-μm CMOS technology. Some of such board-level solutions can be further integrated into the chip design to effectively improve TLU immunity of CMOS IC products.",
author = "Ming-Dou Ker and Hsu, {Sheng Fu}",
year = "2005",
month = sep,
language = "English",
isbn = "158537069X",
series = "Electrical Overstress/Electrostatic Discharge Symposium Proceedings",
booktitle = "2005 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2005",
note = "2005 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2005 ; Conference date: 08-09-2005 Through 16-09-2005",
}