Evaluation of RF and logic performance for 40 nm InAs/InGaAs composite channel HEMTs for high-speed and low-voltage applications

Chien Ying Wu*, Heng-Tung Hsu, Chien I. Kuo, Edward Yi Chang, Yu Lin Chen

*此作品的通信作者

研究成果: Conference contribution同行評審

6 引文 斯高帕斯(Scopus)

摘要

The DC and RF performances of 40 nm high electron mobility transistors (HEMTs) with composite channel of InAs channel and In0.53Ga 0.47As sub-channel were demonstrated. The drain current was 870 mA/mm (Vds=0.4V, Vgs=0V) and maximum gm was 1750 mS/mm (Vds=0.5V, V gs=-0.65V). The devices showed high current gain cutoff frequency (fT) of 420 GHz and low gate delay time of 0.77 ps owing to the nanometer gate length and extremely high electron mobility of the InAs channel. Under low DC power consumption; these InAs HEMTs still exhibited excellent RF and logic performance which indicates these devices have great potential for future high-speed and low-voltage applications.

原文English
主出版物標題Proceedings of 2008 Asia Pacific Microwave Conference, APMC 2008
DOIs
出版狀態Published - 1 12月 2008
事件2008 Asia Pacific Microwave Conference, APMC 2008 - Hong Kong, 中國
持續時間: 16 12月 200820 12月 2008

出版系列

名字Proceedings of 2008 Asia Pacific Microwave Conference, APMC 2008

Conference

Conference2008 Asia Pacific Microwave Conference, APMC 2008
國家/地區中國
城市Hong Kong
期間16/12/0820/12/08

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