@inproceedings{6607788fc13246458f1808a571fac7b0,
title = "ESD protection for mixed-voltage I/O in low- voltage thin-oxide CMOS",
abstract = "An ESD protection design for 1.2V/2.5V mixed-voltage I/O interfaces is discussed. A high-voltage-tolerant power-rail ESD clamp circuit is used; it is realized with low-voltage devices in a 0.13μm CMOS process. The four-mode ESD stresses on the mixed-voltage I/O pad and the whole-chip pin-to-pin ESD protection can be discharged by the proposed ESD protection scheme.",
author = "Ming-Dou Ker and Chang, {Wei Jen} and Wang, {Chang Tzu} and Chen, {Wen Yi}",
year = "2006",
month = dec,
day = "1",
doi = "10.1109/ISSCC.2006.1696284",
language = "English",
isbn = "1424400791",
series = "Digest of Technical Papers - IEEE International Solid-State Circuits Conference",
booktitle = "2006 IEEE International Solid-State Circuits Conference, ISSCC - Digest of Technical Papers",
note = "2006 IEEE International Solid-State Circuits Conference, ISSCC ; Conference date: 06-02-2006 Through 09-02-2006",
}