@inproceedings{7bb0bb1e8d1e4db2bdd9373f314f4b25,
title = "ESD Protection Design with Low-Leakage Consideration for Silicon Chips of IoT Applications",
abstract = "On-chip electrostatic discharge (ESD) protection design with low-leakage consideration for the silicon chips of IoT applications is presented. The proposed ESD protection design uses the fast turn-on silicon-controlled rectifier (SCR) device to implement the power-rail ESD clamp circuit. Experimental results verified in TSMC 28nm CMOS process have shown that the proposed design has advantages of low leakage current (2∼3nA), low trigger voltage (∼2V), high ESD robustness (>8kV), and free to latchup issue.",
keywords = "CMOS, electrostatic discharge (ESD), ESD protection, low-leakage",
author = "Ming-Dou Ker and Lin, {Chun Yu} and Wu, {Yi Han} and Wang, {Wen Tai}",
year = "2018",
month = aug,
day = "24",
doi = "10.1109/CYBER.2017.8446566",
language = "English",
isbn = "9781538604892",
series = "2017 IEEE 7th Annual International Conference on CYBER Technology in Automation, Control, and Intelligent Systems, CYBER 2017",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "1496--1499",
booktitle = "2017 IEEE 7th Annual International Conference on CYBER Technology in Automation, Control, and Intelligent Systems, CYBER 2017",
address = "United States",
note = "7th IEEE Annual International Conference on CYBER Technology in Automation, Control, and Intelligent Systems, CYBER 2017 ; Conference date: 31-07-2017 Through 04-08-2017",
}