ESD protection design of high-linearity SPDT CMOS T/R switch for cellular applications

Tao Yi Hung, Ming-Dou Ker

研究成果: Conference contribution同行評審

2 引文 斯高帕斯(Scopus)

摘要

Electrostatic discharge (ESD) protection design for high-linearity single-pole double-throw (SPDT) transmit/receive switch (T/R switch) at 0.9/1.8 GHz GSM band was proposed and verified in a standard 0.18-µm CMOS process. The SPDT CMOS T/R switch was implemented with body-floating technique, multi-stacked structure, and series-shunt topology to obtain low insertion loss, high power handling capability, and good isolation. With the proposed ESD protection design, the T/R switch can sustain human-body-model (HBM) ESD voltages of 3.5 kV under the positive-to-VSS stress and 5 kV under the negative-to-VSS stress. Experimental results including ESD characteristics, RF performance, and failure analysis are presented.

原文English
主出版物標題2019 IEEE International Symposium on Circuits and Systems, ISCAS 2019 - Proceedings
發行者Institute of Electrical and Electronics Engineers Inc.
頁數5
ISBN(電子)9781728103976
DOIs
出版狀態Published - 26 5月 2019
事件2019 IEEE International Symposium on Circuits and Systems, ISCAS 2019 - Sapporo, Japan
持續時間: 26 5月 201929 5月 2019

出版系列

名字Proceedings - IEEE International Symposium on Circuits and Systems
2019-May
ISSN(列印)0271-4310

Conference

Conference2019 IEEE International Symposium on Circuits and Systems, ISCAS 2019
國家/地區Japan
城市Sapporo
期間26/05/1929/05/19

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