ESD protection design for RF circuits in CMOS technology with low-c implementation

Chun Yu Lin*, Ming-Dou Ker

*此作品的通信作者

    研究成果: Conference contribution › 同行評審

    指紋

    深入研究「ESD protection design for RF circuits in CMOS technology with low-c implementation」主題。共同形成了獨特的指紋。

    Engineering & Materials Science

    Chemical Compounds