@inproceedings{b3ee779c2ff748c4bb864f422f5aad94,
title = "ESD protection design for mixed-voltage I/O interfaces - Overview",
abstract = "Electrostatic discharge (ESD) protection design for mixed-voltage I/O interfaces has been one of the key challenges of system-on-a-chip (SOC) implementation in nanoscale CMOS processes. This paper presents an overview on the design concept and circuit implementations of the ESD protection designs for mixed-voltage I/O interfaces without using the additional thick gate-oxide process. The ESD design constraints in mixed-voltage I/O interfaces, the classification, and analysis of ESD protection designs for mixed-voltage I/O interfaces are presented and discussed.",
author = "Ker, {Ming Dou} and Lin, {Kun Hsien}",
year = "2005",
month = jan,
day = "1",
doi = "10.1109/EDSSC.2005.1635316",
language = "English",
isbn = "0780393392",
series = "2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "493--498",
booktitle = "2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC",
address = "United States",
note = "2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC ; Conference date: 19-12-2005 Through 21-12-2005",
}