ESD protection design for high-speed I/O interface of Stub series Terminated Logic (SSTL) in a 0.25-μm salicided CMOS process

Ming-Dou Ker*, Che Hao Chuang

*此作品的通信作者

    研究成果: Paper › 同行評審

    4 引文 斯高帕斯（Scopus）

    指紋

    深入研究「ESD protection design for high-speed I/O interface of Stub series Terminated Logic (SSTL) in a 0.25-μm salicided CMOS process」主題。共同形成了獨特的指紋。

    Keyphrases

    Computer Science

    Engineering