ESD protection design for fully integrated CMOS RF power amplifiers with waffle-structured SCR

Ming-Dou Ker*, Chun Yu Lin, Guo Xuan Meng

*此作品的通信作者

    研究成果: Conference contribution同行評審

    3 引文 斯高帕斯(Scopus)

    摘要

    Waffle-structured SCR (silicon-controlled rectifier) has been studied as an effective on-chip ESD (electrostatic discharge) protection device for CMOS RF (radio-frequency) circuits. In this work, a novel on-chip ESD protection strategy using the waffle-structured SCR is proposed and co-designed with a CMOS UWB (ultra-wideband) PA (power amplifier). Before ESD stress, the RF performances of the ESD-protected PA have been demonstrated to be as well as that of the unprotected PA. After ESD stress, the unprotected PA was seriously degraded, whereas the ESD-protected PA was keeping the performances well.

    原文English
    主出版物標題2008 IEEE International Symposium on Circuits and Systems, ISCAS 2008
    頁面1292-1295
    頁數4
    DOIs
    出版狀態Published - 19 9月 2008
    事件2008 IEEE International Symposium on Circuits and Systems, ISCAS 2008 - Seattle, WA, United States
    持續時間: 18 5月 200821 5月 2008

    出版系列

    名字Proceedings - IEEE International Symposium on Circuits and Systems
    ISSN(列印)0271-4310

    Conference

    Conference2008 IEEE International Symposium on Circuits and Systems, ISCAS 2008
    國家/地區United States
    城市Seattle, WA
    期間18/05/0821/05/08

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