ESD protection design for broadband RF circuits with decreasing-size distributed protection scheme

Ming-Dou Ker*, Bing Jye Kuo

*此作品的通信作者

    研究成果: Paper同行評審

    5 引文 斯高帕斯(Scopus)

    摘要

    The resulting capacitive load, from the large electrostatic discharge (ESD) protection device for high ESD robustness, has an adverse effect on the performance of broadband RF circuits due to the impedance mismatch and bandwidth degradation. The conventional distributed ESD protection scheme using equal four-stage ESD protection can achieve a better impedance match, but degrade the ESD performance. A new distributed ESD protection structure is proposed in this work to achieve both good ESD robustness and RF performance. The proposed ESD protection circuit is constructed by arranging ESD protection stages with decreasing device size, named decreasing-size distributed ESD (DS-DESD) protection scheme, which is beneficial to the ESD level. The experimental results had shown the human-body-model (HBM) ESD robustness of up to 8kV.

    原文English
    頁面383-386
    頁數4
    DOIs
    出版狀態Published - 6月 2004
    事件Digest of Papers - 2004 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium - Fort Worth, TX, United States
    持續時間: 6 6月 20048 6月 2004

    Conference

    ConferenceDigest of Papers - 2004 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium
    國家/地區United States
    城市Fort Worth, TX
    期間6/06/048/06/04

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