Epitaxial growth of AlAsXSb1-X by MOCVD

Wei-Kuo Chen, Jehn Ou

研究成果: Paper同行評審

摘要

The deposition of AlAsXSb1-X films is studied systematically using an metalorganic chemical vapor deposition growth technique. It is found that the growth of AlAsSb films requires a low V/III ratio to enhance the incorporation of antimony into the solid. The composition of the alloy also depends strongly on the growth temperature. Experimental data shows that films grown at higher temperatures yield much higher AlSb contents in the AlAsxSb1-x alloys. This is contrary to the results reported for GaAsSb films. In our study, we are able to grow metastable AlAsxSbi-x epitaxial films throughout the entire range of the solid composition for temperatures above 550 °C.

原文English
DOIs
出版狀態Published - 12 7月 1994
事件1994 International Electron Devices and Materials Symposium, EDMS 1994 - Hsinchu, Taiwan
持續時間: 12 7月 199415 7月 1994

Conference

Conference1994 International Electron Devices and Materials Symposium, EDMS 1994
國家/地區Taiwan
城市Hsinchu
期間12/07/9415/07/94

指紋

深入研究「Epitaxial growth of AlAsXSb1-X by MOCVD」主題。共同形成了獨特的指紋。

引用此