Enhanced negative substrate bias degradation in nMOSFETs with ultrathin plasma nitrided oxide

Tsu Hsiu Perng*, Chao-Hsin Chien, Ching Wei Chen, Horng-Chih Lin, Chun Yen Chang, Tiao Yuan Huang

*此作品的通信作者

研究成果: Article › 同行評審

4 引文 斯高帕斯（Scopus）

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Engineering & Materials Science

Chemical Compounds