Enhance the luminance intensity of InGaN-GaN light-emitting diode by roughening both the p-GaN surface and the undoped-GaN surface using wafer bonding methods

Wei Chih Peng*, Yew-Chuhg Wu

*此作品的通信作者

研究成果: Conference article同行評審

摘要

An InGaN-GaN light emitting diode (LED) with double roughened surfaces was fabricated by surface-roughening, wafer-bonding and laser lift-off technologies. It was found that the frontside luminance intensity of double roughened LED was 2.77 times higher than that of the conventional LED at an injection current of 20 mA. The backside luminance intensity was 2.37 times higher than that of the conventional LED. This is because the double roughened surfaces can provide photons multiple chances to escape from the LED surface, and redirect photons, which were originally emitted out of the escape cone, back into the escape cone. copyright The Electrochemical Society.

原文English
頁(從 - 到)335-338
頁數4
期刊ECS Transactions
3
發行號6
DOIs
出版狀態Published - 1 12月 2006
事件Semiconductor Wafer Bonding 9: Science, Technology, and Applications - 210th Electrochemical Society Meeting - Cancun, Mexico
持續時間: 29 10月 20063 11月 2006

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