Embedded Deep-Nwell Collector Used to Improve Latch-Up Immunity of Multi-Functional I/O Buffer with Indirect Power-Connected N-Well

Chen Wei Hsu, Ming Dou Ker, Ping Lin Chung, Chin Tung Cheng, Chih Ping Chen

研究成果: Conference contribution同行評審

摘要

In the harsh environment of field applications, the I/O pins of integrated circuit (IC) must be verified through latch-up test with current trigger, according to the standard of JEDEC JESD78F.01. This work presented a specific latch-up challenge encountered in an IC product, where a multi-functional I/O buffer is designed for LCD drivers. Such a multi-functional I/O buffer suffered a failure in latch-up (LU) I test, due to the indirect connection on the N-well of output PMOS to the power supply through a bias switch. To address this LU failure issue, this work thoroughly examines the failure mechanism and proposes an innovative solution. By using an embedded deep-nwell collector, the latch-up immunity of multi-functional I/O buffer with indirect power-connected N-well can be significantly improved.

原文English
主出版物標題2024 IEEE International Reliability Physics Symposium, IRPS 2024 - Proceedings
發行者Institute of Electrical and Electronics Engineers Inc.
ISBN(電子)9798350369762
DOIs
出版狀態Published - 2024
事件2024 IEEE International Reliability Physics Symposium, IRPS 2024 - Grapevine, United States
持續時間: 14 4月 202418 4月 2024

出版系列

名字IEEE International Reliability Physics Symposium Proceedings
ISSN(列印)1541-7026

Conference

Conference2024 IEEE International Reliability Physics Symposium, IRPS 2024
國家/地區United States
城市Grapevine
期間14/04/2418/04/24

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