@inproceedings{14ccd55b25d2418ea59fc59f7b898795,
title = "Embedded Deep-Nwell Collector Used to Improve Latch-Up Immunity of Multi-Functional I/O Buffer with Indirect Power-Connected N-Well",
abstract = "In the harsh environment of field applications, the I/O pins of integrated circuit (IC) must be verified through latch-up test with current trigger, according to the standard of JEDEC JESD78F.01. This work presented a specific latch-up challenge encountered in an IC product, where a multi-functional I/O buffer is designed for LCD drivers. Such a multi-functional I/O buffer suffered a failure in latch-up (LU) I test, due to the indirect connection on the N-well of output PMOS to the power supply through a bias switch. To address this LU failure issue, this work thoroughly examines the failure mechanism and proposes an innovative solution. By using an embedded deep-nwell collector, the latch-up immunity of multi-functional I/O buffer with indirect power-connected N-well can be significantly improved.",
keywords = "deep-nwell collector, latch-up immunity, Latch-up test, LCD driver, multi-functional I/O buffer",
author = "Hsu, {Chen Wei} and Ker, {Ming Dou} and Chung, {Ping Lin} and Cheng, {Chin Tung} and Chen, {Chih Ping}",
note = "Publisher Copyright: {\textcopyright} 2024 IEEE.; 2024 IEEE International Reliability Physics Symposium, IRPS 2024 ; Conference date: 14-04-2024 Through 18-04-2024",
year = "2024",
doi = "10.1109/IRPS48228.2024.10529416",
language = "English",
series = "IEEE International Reliability Physics Symposium Proceedings",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2024 IEEE International Reliability Physics Symposium, IRPS 2024 - Proceedings",
address = "United States",
}