Electronic properties of grain boundaries in polycrystalline silicon

E. S. Yang, E. Poon, H. L. Evans, Wei Hwang

研究成果: Article同行評審

5 引文 斯高帕斯(Scopus)

摘要

The electrical characteristics of grain boundaries in polycrystalline silicon have been investigated. Experiments were performed using a focused laser beam to measure the GB parameters. Theoretical models of phonon-assisted and charge scattering processes are presented in relation to attenuation of the thermionic emission. The results indicate that the GB states behave as extrinsic impurity states which are not sensitive to the misorientation angle between grains. Both majority and minority carrier behavior are described.

原文English
頁(從 - 到)59-64
頁數6
期刊Proceedings of SPIE - The International Society for Optical Engineering
385
DOIs
出版狀態Published - 9 8月 1983

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