Electromigration and Temperature Cycling Tests of Cu-Cu Joints Fabricated by Instant Copper Direct Bonding

  • Kai Cheng Shie
  • , Po Ning Hsu
  • , Yu Jin Li
  • , K. N. Tu
  • , Benson Tzu Hung Lin
  • , Chia Cheng Chang
  • , Chih Chen

研究成果: Conference contribution同行評審

16 引文 斯高帕斯(Scopus)

指紋

深入研究「Electromigration and Temperature Cycling Tests of Cu-Cu Joints Fabricated by Instant Copper Direct Bonding」主題。共同形成了獨特的指紋。

Keyphrases

Engineering

Material Science