Electrical measurements on iridium dioxide nanorods

Y. H. Lin*, T. C. Lee, Juhn-Jong Lin, H. M. Chang, Y. S. Huang

*此作品的通信作者

研究成果: Conference contribution同行評審

2 引文 斯高帕斯(Scopus)

摘要

Iridium dioxide (IrO2) nanorods have been prepared by metal-organic chemical vapor deposition method. Applying the standard electron-beam lithography technique, a single nanorod with a diameter of 110 nm is contacted by three Cr/Au fingers from above. The resistance measurements on this nanorod have been performed between 10 and 300 K, using different probe configurations. We observe that the resistivity ρ of the nanorod has a value ≤ 120 μ cm at 300 K. On the other hand, the temperature dependence of the contact resistance R obeys the law logR ∝ T-1/2 below 100 K. The conduction process through the contact is ascribed to the transport of electrons via hopping in granular metals accidentally formed at the contact region.

原文English
主出版物標題LOW TEMPERATURE PHYSICS
主出版物子標題24th International Conference on Low Temperature Physics - LT24
頁面1484-1485
頁數2
DOIs
出版狀態Published - 2006
事件LOW TEMPERATURE PHYSICS: 24th International Conference on Low Temperature Physics - LT24 - Orlando, FL, United States
持續時間: 10 8月 200617 10月 2006

出版系列

名字AIP Conference Proceedings
850
ISSN(列印)0094-243X
ISSN(電子)1551-7616

Conference

ConferenceLOW TEMPERATURE PHYSICS: 24th International Conference on Low Temperature Physics - LT24
國家/地區United States
城市Orlando, FL
期間10/08/0617/10/06

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