Electrical characteristic variability in 16-nm multi-gate MOSFET current mirror circuit

Hui Wen Cheng, Yiming Li*

*此作品的通信作者

    研究成果: Conference contribution同行評審

    指紋

    深入研究「Electrical characteristic variability in 16-nm multi-gate MOSFET current mirror circuit」主題。共同形成了獨特的指紋。

    Medicine & Life Sciences