TY - GEN
T1 - Efficient write scheme for algorithm-based multi-ported memory
AU - Chen, Bo Ya
AU - Cher, Bo En
AU - Lai, Bo Cheng
PY - 2019/4
Y1 - 2019/4
N2 - This paper proposes REMAP+, a novel design that enables efficient write scheme for algorithmic multi-ported memory, and attains better performance with smaller area. REMAP+ applies the banking structure of memory design and implements the remap table with SRAM cells instead of costly registers. In the remap table, REMAP+ only keeps the most significant bit of write addresses to more efficiently utilize the space in the table. The hash write controller is simplified with the first fit algorithm to handle write conflict with shorter latency. REMAP+ is implemented in a pipeline scheme to further increase the processing throughput. For a 3W1R memory with 16K depth, REMAP+ has attained 22% shorter access latency and 31.3% smaller area when compared with the previous design.
AB - This paper proposes REMAP+, a novel design that enables efficient write scheme for algorithmic multi-ported memory, and attains better performance with smaller area. REMAP+ applies the banking structure of memory design and implements the remap table with SRAM cells instead of costly registers. In the remap table, REMAP+ only keeps the most significant bit of write addresses to more efficiently utilize the space in the table. The hash write controller is simplified with the first fit algorithm to handle write conflict with shorter latency. REMAP+ is implemented in a pipeline scheme to further increase the processing throughput. For a 3W1R memory with 16K depth, REMAP+ has attained 22% shorter access latency and 31.3% smaller area when compared with the previous design.
UR - http://www.scopus.com/inward/record.url?scp=85068606231&partnerID=8YFLogxK
U2 - 10.1109/VLSI-DAT.2019.8741927
DO - 10.1109/VLSI-DAT.2019.8741927
M3 - Conference contribution
AN - SCOPUS:85068606231
T3 - 2019 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2019
BT - 2019 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2019
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2019 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2019
Y2 - 22 April 2019 through 25 April 2019
ER -