跳至主導覽 跳至搜尋 跳過主要內容

Effects on RF Performance for AlGaN/GaN HEMT on Si Substrate with AlGaN Buffer Engineering

研究成果同行評審

3 引文 斯高帕斯(Scopus)

摘要

In this paper, we demonstrate the AlGaN/GaN high electron mobility transistors (HEMTs) on Si substrate using an AlGaN back-barrier (BB) and super-lattice (SL) buffer to achieve high breakdown and low current collapse (CC) properties for Radio-frequency (RF) applications. The HEMTs also demonstrated low initial vertical leakage current, high thermal stability, and smaller drain-lag with reduced leakage currents as compared to the devices using step-graded (SG) AlGaN buffer. Also, the device showed improved RF performances with higher f T and f max as compared to the devices with SG buffer.

原文English
文章編號035002
期刊ECS Journal of Solid State Science and Technology
12
發行號3
DOIs
出版狀態Published - 3月 2023

指紋

深入研究「Effects on RF Performance for AlGaN/GaN HEMT on Si Substrate with AlGaN Buffer Engineering」主題。共同形成了獨特的指紋。

引用此