摘要
In this paper, we demonstrate the AlGaN/GaN high electron mobility transistors (HEMTs) on Si substrate using an AlGaN back-barrier (BB) and super-lattice (SL) buffer to achieve high breakdown and low current collapse (CC) properties for Radio-frequency (RF) applications. The HEMTs also demonstrated low initial vertical leakage current, high thermal stability, and smaller drain-lag with reduced leakage currents as compared to the devices using step-graded (SG) AlGaN buffer. Also, the device showed improved RF performances with higher f T and f max as compared to the devices with SG buffer.
原文 | English |
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文章編號 | 035002 |
期刊 | ECS Journal of Solid State Science and Technology |
卷 | 12 |
發行號 | 3 |
DOIs | |
出版狀態 | Published - 3月 2023 |