Keyphrases
Annealing
100%
Semiconductor Structures
100%
Electrolyte-insulator-semiconductor
100%
Ambience
100%
Multi-analyte Biosensing
100%
Sensing Performance
66%
Material Sensing
66%
Multi-analyte
66%
Treatment Conditions
33%
X Ray Diffraction
33%
Atomic Force Microscopy
33%
Urea
33%
X-ray Photoelectron Spectroscopy
33%
Silicon Substrate
33%
Oxygen Vacancy
33%
Annealing Treatment
33%
Quality Performance
33%
Material Properties
33%
Reflow
33%
Sensing Capability
33%
Annealing Effect
33%
Material Analysis
33%
Material Quality
33%
Na +
33%
Drift Rate
33%
Low Drift
33%
Annealing Ambience
33%
Optimal Treatment
33%
Engineering
Biosensing
100%
Sensing Performance
100%
Semiconductor Structure
100%
Ray Diffraction
50%
Ray Photoelectron Spectroscopy
50%
Atomic Force Microscopy
50%
Biosensor
50%
Silicon Substrate
50%
Oxygen Vacancy
50%
Annealing Effect
50%
Material Quality
50%
Sensing Capability
50%
Material Science
Cerium Oxide
100%
Semiconductor Structure
100%
X-Ray Diffraction
50%
X-Ray Photoelectron Spectroscopy
50%
Silicon
50%
Oxygen Vacancy
50%
Materials Property
50%