Effects of Drain Field Plate Structure and Passivation Dielectrics on Breakdown Voltage of GaN MISHEMT

Catherine Langpoklakpam*, Yi Kai Hsiao, Chun Hsiung Lin, Hao Chung Kuo

*此作品的通信作者

研究成果: Conference contribution同行評審

1 引文 斯高帕斯(Scopus)

指紋

深入研究「Effects of Drain Field Plate Structure and Passivation Dielectrics on Breakdown Voltage of GaN MISHEMT」主題。共同形成了獨特的指紋。

Keyphrases

Engineering