摘要
Pulsed laser deposition was used for the preparation of single-phase electron-doped manganite thin films with nominal composition of La 0.7Ce0.3MnO0 (LCeMO) on SrTiO3 (100) substrates. In situ post deposition annealing was done to relax the possible epitaxial in-plane tensile strain between the film and the substrate. This leads to an increasing c-axis lattice constant accompanied by the formation of secondary CeO2 phase and higher metal-insulator transition temperature. The result is indicative of a strong coupling between the electron and lattice degree of freedom.
原文 | English |
---|---|
頁(從 - 到) | 4357-4361 |
頁數 | 5 |
期刊 | Journal of Applied Physics |
卷 | 96 |
發行號 | 8 |
DOIs | |
出版狀態 | Published - 15 10月 2004 |