摘要
A thin layer of Si seed was employed to help nucleate low-temperature selective SiGe epitaxial film in recessed source and drain areas. In combination with pre-epi wet clean and low-temperature chemical bake, use of Si seed resulted in improved SiGe film morphology and micro-loading effect, and further improved dislocation on the lateral recessed interface. copyright The Electrochemical Society.
原文 | English |
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頁(從 - 到) | 245-248 |
頁數 | 4 |
期刊 | ECS Transactions |
卷 | 3 |
發行號 | 7 |
DOIs | |
出版狀態 | Published - 1 12月 2006 |
事件 | SiGe and Ge: Materials, Processing, and Devices - 210th Electrochemical Society Meeting - Cancun, 墨西哥 持續時間: 29 10月 2006 → 3 11月 2006 |